Offer the term “metrology equipment” to a group of industrial or manufacturing engineers in a word-association test and it’s highly likely CMM (coordinate measuring machine) would be the response. Yet, unlike a probe-based measuring methodology, X-ray micro computed tomography (μCT) not only has the accuracy, resolution, speed, and flexibility manufacturers require, it provides details and insight unattainable by other means, (think porosity and density mapping, for example).